NOVEMBER 5-9, 2000    KANSAS CITY, MISSOURI

A A C C   2 0 0 0   A n n u a l   M e e t i n g

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Detection of fungal damage in wheat by hyperspectral image analysis.
S. R. DELWICHE (1), M. S. Kim (2), and P. M. Mehl (3). (1-3) USDA-ARS, Beltsville Agricultural Research Center, Instrumentation and Sensing Laboratory, Beltsville, MD 20705.

Fusarium head blight, also known as scab, is a fungal disease that occurs in wheat and other small grains. Scab in wheat causes kernels to be shrunken and chaulky white in appearance. It is of concern to processors, not only because of diminished yield, but also because of its potential to produce the mycotoxin deoxynivalenol, otherwise known as vomitoxin. On a limited set of hard red winter and spring wheats, the spectral (430-900 nm) and spatial bases for scab damage are examined by a hyperspectral imaging system developed at our Beltsville laboratory. Images, both reflectance and fluorescence emission with UV-A excitation, are examined for their ability to identify scab. The eventual goal is to select two to four wavelengths that can be used in an inexpensive (<$10K) multispectral imaging system for official grain inspection. Aspects of data collection, data reduction, and the shape, color and texture of scab-damaged kernels will be discussed.

 


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