Publication no. C-2001-0411-01R |  VIEW ARTICLE

Image Analysis of Whole Grains: A Noninvasive Method to Predict Semolina Yield in Durum Wheat.

P. Novaro (1,2), F. Colucci (1), G. Venora (2), and M. G. D'Egidio (1). (1) Istituto Sperimentale per la Cerealicoltura, via Cassia 176, 00191 Rome, Italy. (2) Corresponding author. Phone: +39 6 3295705; Fax +39 6 36298457; E-mail: <novaro@cerealicoltura.it> (3) Stazione Sperimentale di Granicoltura, via G. Rossini 1, 95041 Caltagirone (CT), Italy. Cereal Chem. 78(3):217-221. Accepted December 19, 2000. Copyright 2001 American Association of Cereal Chemists, Inc.

Durum wheat grain samples (n = 327) harvested during 1998 and 1999 in eight different Italian agroclimatic areas and representative of the main Italian cultivars were analyzed. Image analysis of whole grains allowed five size and shape descriptors (length of minor and major axes, perimeter, area, and ellipsoidal volume) to be measured on 100 grains for each sample. By multiple regression analysis, shape measures more valid to explain semolina yield were identified. By combining these measures with test weight or 1,000-seed weight, equations useful to predict semolina yield were developed.